Characterisation of reliability of compound semiconductor devices using electrical pulses

Brandt, M.M.BrandtKrozer, V.V.KrozerSchuessler, M.M.SchuesslerBock, KarlheinzKarlheinzBockHartnagel, H. L.H. L.Hartnagel2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1104Characterisation of reliability of compound semiconductor devices using electrical pulsesJournal article