Crupi, FeliceFeliceCrupiAlioto, MassimoMassimoAliotoFranco, JacopoJacopoFrancoMagnone, PaoloPaoloMagnoneKaczer, BenBenKaczerGroeseneken, GuidoGuidoGroesenekenMitard, JeromeJeromeMitardWitters, LiesbethLiesbethWittersHoffmann, Thomas Y.Thomas Y.Hoffmann2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/18756Experimental analysis of buried SiGe pMOSFETs from the perspective of aggressive voltage scalingProceedings paper