Accurate on-wafer measurement of the large-signal behavior of a nonlinear microwave device

Verspecht, J.J.VerspechtDebie, PeterPeterDebieMartens, LucLucMartensBarel, A.A.Barel2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1638Accurate on-wafer measurement of the large-signal behavior of a nonlinear microwave deviceJournal article