Saini, NishantNishantSainiTierno, DavideDavideTiernoCroes, KristofKristofCroesAfanasiev, ValeriValeriAfanasievVan Houdt, JanJanVan Houdt2024-11-212024-04-012024-11-2120240038-1101WOS:001182552000001https://imec-publications.be/handle/20.500.12860/43761Experimental study of time-dependent dielectric degradation by means of random telegraph noise spectroscopyJournal article10.1016/j.sse.2024.108877WOS:001182552000001TRAP GENERATION