Ceric, HajdinHajdinCericZahedmanesh, HoumanHoumanZahedmanesh2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/32673Advanced modeling and simulation of Cu nano-interconnects reliabilityProceedings paperhttps://iitc-conference.org/2019-iitc-mam-program/