Performance degradation of RF circuits due to impact of digital switching noise

Soens, CharlotteCharlotteSoensVan der Plas, GeertGeertVan der PlasWambacq, PietPietWambacqDonnay, StephaneStephaneDonnayKuijk, MaartenMaartenKuijkBarel, A.A.Barel2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/11254Performance degradation of RF circuits due to impact of digital switching noiseJournal article