New insights into the wide ID range Channel Hot-Carrier degradation in high-k based devices

Amat, EsteveEsteveAmatRodríguez, RosanaRosanaRodríguezNafria, MontseMontseNafriaAymerich, XavierXavierAymerichKauerauf, ThomasThomasKaueraufDegraeve, RobinRobinDegraeveGroeseneken, GuidoGuidoGroeseneken2021-10-172021-10-172009https://imec-publications.be/handle/20.500.12860/14898New insights into the wide ID range Channel Hot-Carrier degradation in high-k based devicesProceedings paper