Hot carrier degradation phenomena in lateral and vertical DMOS transistors

Moens, PeterPeterMoensVan den Bosch, GeertGeertVan den BoschGroeseneken, GuidoGuidoGroeseneken2021-10-152021-10-152004-04https://imec-publications.be/handle/20.500.12860/9312Hot carrier degradation phenomena in lateral and vertical DMOS transistorsJournal article