Electron traps at sidewalls of vertical n+-GaAs/n--InGaP/p+-GaAs diodes detected with deep-level transient spectroscopy

Yu, HaoHaoYuHsu, BrentBrentHsuVais, AbhitoshAbhitoshVaisSimoen, EddyEddySimoenWaldron, NiamhNiamhWaldronCollaert, NadineNadineCollaert2021-10-282021-10-282019-06https://imec-publications.be/handle/20.500.12860/34500Electron traps at sidewalls of vertical n+-GaAs/n--InGaP/p+-GaAs diodes detected with deep-level transient spectroscopyProceedings paperhttps://ieeexplore.ieee.org/document/8802885