Duhayon, NatasjaNatasjaDuhayonXu, MingweiMingweiXuAlvarez, DavidDavidAlvarezEyben, PierrePierreEybenVandervorst, WilfriedWilfriedVandervorstHellemans, L.L.HellemansRochefort, ChristelleChristelleRochefortVan Dalen, RobRobVan Dalen2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6295Characterization of vertical resurf diodes using scanning probe microsopyOral presentation