Direct estimation of captive cross sections in the presence of low capture: application of the identifcation of quenched-in deep-level defects in Ge

Segers, SiegfriedSiegfriedSegersLauwaert, JohanJohanLauwaertClauws, PaulPaulClauwsSimoen, EddyEddySimoenVanhellemont, JanJanVanhellemontCallens, FreddyFreddyCallensVrielinck, HenkHenkVrielinck2021-10-222021-10-2220140268-1242https://imec-publications.be/handle/20.500.12860/24502Direct estimation of captive cross sections in the presence of low capture: application of the identifcation of quenched-in deep-level defects in GeJournal article