Chintala, Ravi ChandraRavi ChandraChintalaEyben, PierrePierreEybenVandervorst, WilfriedWilfriedVandervorstArmini, SilviaSilviaArminiSun, YitingYitingSun2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/20456Electrical properties of APTMS SAM layers studied with conductive atomic force microscopeOral presentation