Zhao, C.Z.C.Z.ZhaoZhang, J.F.J.F.ZhangGroeseneken, GuidoGuidoGroesenekenDegraeve, RobinRobinDegraeve2021-10-152021-10-152004-08https://imec-publications.be/handle/20.500.12860/9978Hole traps in silicon dioxides - Part II: Generation mechanismJournal article