Franco, JacopoJacopoFrancoKaczer, BenBenKaczerRoussel, PhilippePhilippeRousselCho, Moon JuMoon JuChoGrasser, TiborTiborGrasserArimura, HiroakiHiroakiArimuraCott, DaireDaireCottMitard, JeromeJeromeMitardWitters, LiesbethLiesbethWittersWaldron, NiamhNiamhWaldronZhou, DaisyDaisyZhouAlian, AliRezaAliRezaAlianVais, AbhitoshAbhitoshVaisLin, DennisDennisLinMartens, KoenKoenMartensPourghaderi, Mohammad AliMohammad AliPourghaderiSioncke, SonjaSonjaSionckeCollaert, NadineNadineCollaertThean, AaronAaronTheanHeyns, MarcMarcHeynsGroeseneken, GuidoGuidoGroeseneken2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/23830Reliability challenges of high mobility channel technologies: SiGe, Ge and InGaAsMeeting abstract