Makarov, A.A.MakarovJech, M.M.JechTyaginov, StanislavStanislavTyaginovVaisman Chasin, AdrianAdrianVaisman ChasinBury, ErikErikBuryVandemaele, MichielMichielVandemaeleGrill, AlexanderAlexanderGrillDe Keersgieter, AnAnDe KeersgieterLinten, DimitriDimitriLintenKaczer, BenBenKaczer2021-11-232021-11-022021-11-2320201946-1550WOS:000635636600016https://imec-publications.be/handle/20.500.12860/37990Physical Modeling the Impact of Self-Heating on Hot-Carrier Degradation in pNWFETsProceedings paper*****************WOS:000635636600016