A new lifetime extrapolation technique for LDD NMOSFETS under hot-carrier degradation

Dreesen, R.R.DreesenCroes, KrisKrisCroesManca, JeanJeanMancaDe Ceuninck, WardWardDe CeuninckDe Schepper, LucLucDe SchepperPergoot, A.A.PergootGroeseneken, GuidoGuidoGroeseneken2021-10-062021-10-061999https://imec-publications.be/handle/20.500.12860/3436A new lifetime extrapolation technique for LDD NMOSFETS under hot-carrier degradationProceedings paper