Measurement of direct and indirect bandgaps in synthetic ultrathin MoS2 and WS2 films from photoconductivity spectra

Shlyakhov, IlyaIlyaShlyakhovIakoubovskii, K.K.IakoubovskiiBanerjee, SreetamaSreetamaBanerjeeGaur, AbhinavAbhinavGaurLin, DennisDennisLinAsselberghs, IngeIngeAsselberghsRadu, IulianaIulianaRaduChai, J.J.ChaiYang, M.M.YangWang, S. J.S. J.WangHoussa, MichelMichelHoussaStesmans, A.A.StesmansAfanas'ev, V.V.Afanas'ev2021-12-082021-11-022021-12-0820210021-8979WOS:000640620700002https://imec-publications.be/handle/20.500.12860/37997Measurement of direct and indirect bandgaps in synthetic ultrathin MoS2 and WS2 films from photoconductivity spectraJournal article10.1063/5.0046305WOS:000640620700002