Defect location identification for cell-aware test

Gao, ZhanZhanGaoMalagi, Santosh S.Santosh S.MalagiSwenton, JoeJoeSwentonHuisken, JosJosHuiskenGoossens, KeesKeesGoossensMarinissen, Erik JanErik JanMarinissen2021-10-272021-10-272019-07https://imec-publications.be/handle/20.500.12860/33011Defect location identification for cell-aware testProceedings paper