Ohyama, HidenoriHidenoriOhyamaNagano, TakashiTakashiNaganoTakakurairo, KenichiroKenichiroTakakurairoMidorikawa, MasahikoMasahikoMidorikawaKuboyama, SatoshiSatoshiKuboyamaBargallo Gonzalez, MireiaMireiaBargallo GonzalezSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-172021-10-172008https://imec-publications.be/handle/20.500.12860/14247Study on radiation damages of SiGe devices by irradiationProceedings paper