Rinaudo, PietroPietroRinaudoVaisman Chasin, AdrianAdrianVaisman ChasinFranco, JacopoJacopoFrancoWu, ZhichengZhichengWuSubhechha, SubhaliSubhaliSubhechhaArutchelvan, GouthamGouthamArutchelvanEneman, GeertGeertEnemanYengula Venkata Ramana, BhuvaneshwariBhuvaneshwariYengula Venkata RamanaRassoul, NouredineNouredineRassoulDelhougne, RomainRomainDelhougneKaczer, BenBenKaczerDe Wolf, IngridIngridDe WolfKar, Gouri SankarGouri SankarKar2023-11-212023-10-112023-11-2120231530-4388WOS:001063339300005https://imec-publications.be/handle/20.500.12860/42701Degradation Mapping and Impact of Device Dimension on IGZO TFTs BTIJournal article10.1109/TDMR.2023.3282298WOS:001063339300005RELAXATION