Investigation of the frequency dispersion effect in the root-model applied to conventional and floating-gate MESFET's

Van Den Bosch, SvenSvenVan Den BoschMartens, LucLucMartens2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/2212Investigation of the frequency dispersion effect in the root-model applied to conventional and floating-gate MESFET'sJournal article