Wu, Tian-LiTian-LiWuBakeroot, BenoitBenoitBakerootLiang, HuHuLiangPosthuma, NielsNielsPosthumaYou, ShuzhenShuzhenYouRonchi, NicoloNicoloRonchiStoffels, SteveSteveStoffelsMarcon, DenisDenisMarconDecoutere, StefaanStefaanDecoutere2021-10-242021-10-2420170741-3106https://imec-publications.be/handle/20.500.12860/29953Analysis of the gate capacitance-voltage characteristics in p-GaN/AlGaN/GaN heterostructuresJournal articlehttp://ieeexplore.ieee.org/document/8089745/