Degradation of the electrical performance and floating body efffects in ultra thin gate oxide FD-SOI nMOSFETs by 2-MeV electron irradiation

Hayama, K.K.HayamaRafi, J.M.J.M.RafiTakakura, K.K.TakakuraOhyama, H.H.OhyamaMercha, AbdelkarimAbdelkarimMerchaSimoen, EddyEddySimoenClaeys, CorCorClaeysKuboyama, S.S.KuboyamaOka, K.K.OkaMatsuda, S.S.Matsuda2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/9004Degradation of the electrical performance and floating body efffects in ultra thin gate oxide FD-SOI nMOSFETs by 2-MeV electron irradiationProceedings paper