Marinissen, Erik JanErik JanMarinissenZorian, YervantYervantZorianKonijnenburg, MarioMarioKonijnenburgHuang, Chih-TsunChih-TsunHuangHsieh, Ping-HsuanPing-HsuanHsiehCockburn, PeterPeterCockburnDelvaux, JeroenJeroenDelvauxRozic, VladimirVladimirRozicYang, BohanBohanYangSingelee, DaveDaveSingeleeVerbauwhede, IngridIngridVerbauwhedeMayor, CedricCedricMayorvan Rijsinge, RobertRobertvan RijsingeReyes, CocoyCocoyReyes2021-10-232021-10-232016-05https://imec-publications.be/handle/20.500.12860/26962IoT: Source of test challengesProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7519331