Smith, KenKenSmithMarinissen, Erik JanErik JanMarinissen2021-10-222021-10-2220141526-1344https://imec-publications.be/handle/20.500.12860/24546Probing 25μm-diameter micro-bumps for Wide-I/O 3D SICsJournal articlehttp://www.chipscalereview.com/issues/0114/index.php