Segers, SiegfriedSiegfriedSegersLauwaert, JohanJohanLauwaertClauws, PaulPaulClauwsCallens, FreddyFreddyCallensVanhellemont, JanJanVanhellemontSimoen, EddyEddySimoenVrielinck, HenkHenkVrielinck2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/24501Deep-level transient spectroscopic study of quenched-in defects in germaniumOral presentation