Weckx, PieterPieterWeckxKaczer, BenBenKaczerSimicic, MarkoMarkoSimicicParvais, BertrandBertrandParvaisLinten, DimitriDimitriLinten2021-10-292021-10-292020https://imec-publications.be/handle/20.500.12860/36311Defect-Based Compact Modeling of Random Telegraph NoiseBook chapterhttps://doi.org/10.1007/978-3-030-37500-3_16