From parameter extraction, variability models to yield prediction

Xing, YufeiYufeiXingDong, JiaxingJiaxingDongKhan, Muhammad UmarMuhammad UmarKhanYe, YinghaoYinghaoYeSpina, DomenicoDomenicoSpinaDhaene, TomTomDhaeneBogaerts, WimWimBogaerts2021-10-262021-10-262018https://imec-publications.be/handle/20.500.12860/32301From parameter extraction, variability models to yield predictionProceedings paper