Lessons learned from low-frequency noise studies on fully depleted UTBOX silicon-on-insulator MOSFETs

Simoen, EddyEddySimoenAoulaiche, MarcMarcAoulaicheSantos, Sara Deresste D.Sara Deresste D.SantosMartino, JoaoJoaoMartinoStrobel, VincentVincentStrobelCretu, BogdanBogdanCretuRoutoure, Jean-MarcJean-MarcRoutoureCarin, RegisRegisCarinLuque Rodriguez, AbrahamAbrahamLuque RodriguezJimenez Tejada, Juan AntonioJuan AntonioJimenez TejadaClaeys, CorCorClaeys2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/23086Lessons learned from low-frequency noise studies on fully depleted UTBOX silicon-on-insulator MOSFETsProceedings paper10.1149/05305.0049ecst