Rolain, Y.Y.RolainVan Moer, W.W.Van MoerVandersteen, GerdGerdVandersteenVan Heijningen, MarcMarcVan Heijningen2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5618Measuring mixed-signal substrate couplingJournal article