Study of a-Si:H tail state distributions through analytical multiple-trapping modeling

Arkhipov, VladimirVladimirArkhipovEmelianova, EvgueniaEvgueniaEmelianovaBrinza, MonicaMonicaBrinzaAdriaenssens, GuyGuyAdriaenssens2021-10-162021-10-162005-04https://imec-publications.be/handle/20.500.12860/10028Study of a-Si:H tail state distributions through analytical multiple-trapping modelingJournal article