Modelling and microstructural characterisation of incubation, time-dependent drift and saturation during electromigration in Al-Si-Cu stripes

Witvrouw, AnnAnnWitvrouwBender, HugoHugoBenderRoussel, PhilippePhilippeRousselMaex, KarenKarenMaex2021-10-142021-10-141999https://imec-publications.be/handle/20.500.12860/4030Modelling and microstructural characterisation of incubation, time-dependent drift and saturation during electromigration in Al-Si-Cu stripesJournal article