Goes, WolfgangWolfgangGoesToledano Luque, MariaMariaToledano LuqueBaumgartner, O.O.BaumgartnerSchanovsky, FrankFrankSchanovskyKaczer, BenBenKaczerGrasser, TiborTiborGrasser2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22405A comprehensive model for correlated drain and gate current fluctuationsProceedings paper