Total ionizing dose damage in deep submicron partially depleted SOI MOSFETs induced by proton irradiation

Simoen, EddyEddySimoenRafi, Joan MarcJoan MarcRafiMercha, AbdelkarimAbdelkarimMerchaClaeys, CorCorClaeys2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/9609Total ionizing dose damage in deep submicron partially depleted SOI MOSFETs induced by proton irradiationJournal article