Time-dependent degradation law for reliable lifetime prediction in sub-0.25μm bulk silicon N-MOSFETs

Szelag, B.B.SzelagKubicek, StefanStefanKubicekDe Meyer, KristinKristinDe MeyerBalestra, F.F.Balestra2021-10-142021-10-141999https://imec-publications.be/handle/20.500.12860/3871Time-dependent degradation law for reliable lifetime prediction in sub-0.25μm bulk silicon N-MOSFETsJournal article