Tyaginov, StanislavStanislavTyaginovVaisman Chasin, AdrianAdrianVaisman ChasinMakarov, A.A.MakarovEl-Sayed, A.A.El-SayedJech, M.M.JechDe Keersgieter, AnAnDe KeersgieterEneman, GeertGeertEnemanVandemaele, MichielMichielVandemaeleFranco, JacopoJacopoFrancoLinten, DimitriDimitriLintenKaczer, BenBenKaczer2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/34161Physics-based modeling of hot-carrier degradation in Ge NWFETsProceedings paper