High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices

Vassilev, VesselinVesselinVassilevJenei, SnezanaSnezanaJeneiGroeseneken, GuidoGuidoGroesenekenVenegas, RafaelRafaelVenegasThijs, StevenStevenThijsDe Heyn, VincentVincentDe HeynMahadeva Iyer, NatarajanNatarajanMahadeva IyerSteyaert, M.M.SteyaertMaes, HermanHermanMaes2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/8349High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devicesJournal article