In-situ curvature and diffraction measurements on thin-film Ni/Ge(100) and Ni/Ge(111) solid state reactions

Opsomer, KarlKarlOpsomerDeduytsche, D.D.DeduytscheDetavernier, C.C.DetavernierLavoie, C.C.LavoieLauwers, AnneAnneLauwersVan Meirhaeghe, R.L.R.L.Van MeirhaegheMaex, KarenKarenMaex2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12652In-situ curvature and diffraction measurements on thin-film Ni/Ge(100) and Ni/Ge(111) solid state reactionsMeeting abstract