Part II: Investigation of subthreshold swing in line tunnel FETs using bias stress measurements

Walke, AmeyAmeyWalkeVandooren, AnneAnneVandoorenKaczer, BenBenKaczerVerhulst, AnneAnneVerhulstRooyackers, RitaRitaRooyackersSimoen, EddyEddySimoenHeyns, MarcMarcHeynsRao, V RamgopalV RamgopalRaoGroeseneken, GuidoGuidoGroesenekenCollaert, NadineNadineCollaertThean, AaronAaronThean2021-10-212021-10-2120130018-9383https://imec-publications.be/handle/20.500.12860/23368Part II: Investigation of subthreshold swing in line tunnel FETs using bias stress measurementsJournal articlehttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6658861&queryText%3DPart+II%3A+Investigation+of+subthreshold+swin