The Role of Mobility Degradation in the BTI-Induced RO Aging in a 28-nm Bulk CMOS Technology

Sangani, DishantDishantSanganiDiaz Fortuny, JavierJavierDiaz FortunyBury, ErikErikBuryKaczer, BenBenKaczerGielen, GeorgesGeorgesGielen2024-05-072023-07-152024-05-0720231541-7026WOS:001007431500105https://imec-publications.be/handle/20.500.12860/42159The Role of Mobility Degradation in the BTI-Induced RO Aging in a 28-nm Bulk CMOS TechnologyProceedings paper10.1109/IRPS48203.2023.10118026978-1-6654-5672-2WOS:001007431500105RELIABILITY