Status report of IEEE P1838 - Standard for test access architecture for three-dimensional stacked integrated circuits

Marinissen, Erik JanErik JanMarinissenCron, AdamAdamCron2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/19387Status report of IEEE P1838 - Standard for test access architecture for three-dimensional stacked integrated circuitsOral presentation