Impact of MOSFET oxide breakdown on digital circuit operation and reliability

Kaczer, BenBenKaczerDegraeve, RobinRobinDegraeveGroeseneken, GuidoGuidoGroesenekenRasras, MahmoudMahmoudRasrasKubicek, StefanStefanKubicekVandamme, EwoutEwoutVandammeBadenes, GonçalGonçalBadenes2021-10-142021-10-142000https://imec-publications.be/handle/20.500.12860/4462Impact of MOSFET oxide breakdown on digital circuit operation and reliabilityProceedings paper