Investigation into the impact of source-drain series resistance on electrical parameters of AlGaN/GaN high electron mobility transistors

Panzo, Eduardo CangaEduardo CangaPanzoGraziano, NiltonNiltonGrazianoSimoen, EddyEddySimoende Andrade, Maria Gloria CanoMaria Gloria Canode Andrade2025-05-302025-05-302025-OCT0038-1101WOS:001494767200001https://imec-publications.be/handle/20.500.12860/45740Investigation into the impact of source-drain series resistance on electrical parameters of AlGaN/GaN high electron mobility transistorsJournal article10.1016/j.sse.2025.109138WOS:001494767200001