Kao, FrankFrankKaoVerhulst, AnneAnneVerhulstVandenberghe, WilliamWilliamVandenbergheGroeseneken, GuidoGuidoGroesenekenDe Meyer, KristinKristinDe Meyer2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/19158The impact of junction angle on tunnel FETsProceedings paper