Interface admittance measurement and simulation of dual gated CVD WS2 MOSCAPs: Mapping the D-IT(E) profile

Koladi Mootheri, VivekVivekKoladi MootheriWu, XiangyuXiangyuWuCott, DaireDaireCottGroven, BenjaminBenjaminGrovenHeyns, MarcMarcHeynsAsselberghs, IngeIngeAsselberghsRadu, IulianaIulianaRaduLin, DennisDennisLin2023-01-052021-11-022023-01-0520210038-1101WOS:000672563600014https://imec-publications.be/handle/20.500.12860/37791Interface admittance measurement and simulation of dual gated CVD WS2 MOSCAPs: Mapping the D-IT(E) profileJournal article10.1016/j.sse.2021.108035WOS:000672563600014