Analysing impact of MOSFET oxide breakdown by small- and large-signal HF measurements

Schreurs, DominiqueDominiqueSchreursPantisano, LuigiLuigiPantisanoKaczer, BenBenKaczer2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/9572Analysing impact of MOSFET oxide breakdown by small- and large-signal HF measurementsProceedings paper