Claeys, CorCorClaeysSimoen, EddyEddySimoenRafi, J.M.J.M.RafiPavanello, M.A.M.A.PavanelloMartino, J.A.J.A.Martino2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/11881Physical characterization and reliability aspects of MuGFETsProceedings paper