Analysis of leakage currents and impact on off-state power consumption for CMOS technology in the 100-nm regime

Henson, KirklenKirklenHensonYang, N.N.YangKubicek, StefanStefanKubicekVogel, E. M.E. M.VogelWortman, J.J.WortmanDe Meyer, KristinKristinDe MeyerNaem, AbdallaAbdallaNaem2021-10-142021-10-142000https://imec-publications.be/handle/20.500.12860/4425Analysis of leakage currents and impact on off-state power consumption for CMOS technology in the 100-nm regimeJournal article