Degradation and nitridation dependence of steady-state stress induced leakage current (SILC)

De Blauwe, JanJanDe BlauweDegraeve, RobinRobinDegraeveBellens, RudiRudiBellensVan Houdt, JanJanVan HoudtGroeseneken, GuidoGuidoGroesenekenMaes, HermanHermanMaes2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1148Degradation and nitridation dependence of steady-state stress induced leakage current (SILC)Oral presentation