Van den Bulcke, J.J.Van den BulckeBoone, M.A.M.A.BooneDhaene, J.J.DhaeneVan Loo, D.D.Van LooVan Hoorebeke, L.L.Van HoorebekeBoone, M.N.M.N.BooneWyffels, FrancisFrancisWyffelsBeeckman, H.H.BeeckmanVan Acker, J.J.Van AckerDe Mil, T.T.De Mil2021-10-272021-10-272019-101095-8290https://imec-publications.be/handle/20.500.12860/34196Advanced X-ray CT scanning can boost tree ring research for earth system sciencesJournal articlehttps://doi.org/10.1093/aob/mcz126